Exam 30: Processing of Integrated Circuits
Exam 1: Introduction and Overview of Manufacturing23 Questions
Exam 2: The Nature of Materials18 Questions
Exam 3: Mechanical Properties of Materials22 Questions
Exam 4: Physical Properties of Materials13 Questions
Exam 5: Engineering Materials51 Questions
Exam 6: Dimensions, Surfaces, and Their Measurement18 Questions
Exam 7: Fundamentals of Metal Casting20 Questions
Exam 8: Metal Casting Processes23 Questions
Exam 9: Glassworking15 Questions
Exam 10: Shaping Processes for Plastics27 Questions
Exam 11: Processing of Polymer Matrix Composites and Rubber23 Questions
Exam 12: Powder Metallurgy17 Questions
Exam 13: Processing of Ceramics and Cermets15 Questions
Exam 14: Fundamentals of Metal Forming10 Questions
Exam 15: Bulk Deformation Processes in Metal Workiing20 Questions
Exam 16: Sheet Metalworking20 Questions
Exam 17: Theory of Metal Machining17 Questions
Exam 18: Machining Operations and Machine Tools26 Questions
Exam 19: Cutting Tool Technology20 Questions
Exam 20: Economic and Product Design Considerations13 Questions
Exam 21: Grinding and Other Abrasive Processes22 Questions
Exam 22: Nontraditional Machining and Thermal Cutting19 Questions
Exam 23: Heat Treatment of Metals14 Questions
Exam 24: Surface Processing Operations19 Questions
Exam 25: Fundamentals of Welding16 Questions
Exam 26: Welding Processes23 Questions
Exam 27: Brazing, Soldering, and Adhesive Bonding16 Questions
Exam 28: Mechanical Assembly16 Questions
Exam 29: Rapid Prototyping and Additive Manufacturing8 Questions
Exam 30: Processing of Integrated Circuits23 Questions
Exam 31: Electronics Assembly and Packaging16 Questions
Exam 32: Microfabrication Technologies12 Questions
Exam 33: Nanofabrication Technologies15 Questions
Exam 34: Automation Technologies for Manufacturing Systems20 Questions
Exam 35: Integrated Manufacturing Systems19 Questions
Exam 36: Process Planning and Production Control25 Questions
Exam 37: Quality Control and Inspection15 Questions
Select questions type
How many electronic devices would be contained in an IC chip in order for it to be classified in the VLSI category (one best answer):
(Multiple Choice)
4.9/5
(43)
Multiprobe testing is a computer-controlled testing method that is performed on the integrated circuits immediately after they have been separated from the wafer:
(True/False)
4.8/5
(28)
Silicon that has been grown from a melt into a large single-crystal ingot by the Czochralski process is called which one of the following:
(Multiple Choice)
4.8/5
(42)
Showing 21 - 23 of 23
Filters
- Essay(0)
- Multiple Choice(0)
- Short Answer(0)
- True False(0)
- Matching(0)